S. Duzellier: search on Z-Library

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1

Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror

C. Bestory, F. Marc, S. Duzellier, H. Levi

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 781 KB

english, 2009

2

Spectrometers Results of Material Exposure and Degradation Experiment Onboard International Space Station

Rejsek-Riba, V., Inguimbert, V., Duzellier, S., Pons, C., Crepel, M., Tighe, A. P.

Journal:

Journal of Spacecraft and Rockets

Year:

2011

Language:

english

File:

PDF, 2.36 MB

english, 2011

3

Radiation effects on electronic devices in space

Sophie Duzellier

Journal:

Aerospace Science and Technology

Year:

2005

Language:

english

File:

PDF, 572 KB

english, 2005

4

Multi-scale modeling to investigate the single event effects for space missions

G. Hubert, S. Bourdarie, L. Artola, S. Duzellier, J.-F. Roussel

Journal:

Acta Astronautica

Year:

2011

Language:

english

File:

PDF, 1.13 MB

english, 2011

5

In-flight observations of the radiation environment and its effects on devices in the SAC-C polar orbit

Falguere, D., Boscher, D., Nuns, T., Duzellier, S., Bourdarie, S., Ecoffet, R., Barde, S., Cueto, J., Alonzo, C., Hoffman, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2002

Language:

english

File:

PDF, 683 KB

english, 2002

6

Collected Charge Analysis for a New Transient Model by TCAD Simulation in 90 nm Technology

Artola, Laurent, Hubert, G., Duzellier, S., Bezerra, Francoise

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 1.00 MB

english, 2010

7

[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - Comparison between ground tests and flight data for two static 32 KB memories

Cheynet, P., Valazco, R., Ecoffet, R., Duzellier, S., David, J.P., Loquet, J.G.

Year:

2000

Language:

english

File:

PDF, 385 KB

english, 2000

8

Space Environmental Testing of Novel Candidate Materials for Multilayer Insulation

Moser, Martin, Ranzenberger, Christian, Duzellier, Sophie

Journal:

Journal of Spacecraft and Rockets

Year:

2016

Language:

english

File:

PDF, 1.14 MB

english, 2016

9

Space radiation evaluation of 16 Mbit DRAMs for mass memory applications

Calvel, P., Lamothe, P., Barillot, C., Ecoffet, R., Duzellier, S., Stassinopoulos, E.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1994

Language:

english

File:

PDF, 374 KB

english, 1994

10

Simulation of Single and Multi-Node Collection: Impact on SEU Occurrence in Nanometric SRAM Cells

Toure, Gnima, Hubert, Guillaume, Castellani-Coulie, Karine, Duzellier, Sophie, Portal, Jean-Michel

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.20 MB

english, 2011

11

ICARE On-Board SAC-C: More Than 8 Years of SEU and MCU, Analysis and Prediction

Boatella, C., Hubert, G., Ecoffet, R., Duzellier, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 3.13 MB

english, 2010

12

Impact of the Solar Flares on the SER Dynamics on Micro and Nanometric Technologies

Hubert, G., Bourdarie, S., Artola, L., Duzellier, S., Boattela-Polo, C., Bezerra, F., Ecoffet, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 1.20 MB

english, 2010

13

In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations

Artola, Laurent, Velazco, Raoul, Hubert, Guillaume, Duzellier, Sophie, Nuns, Thierry, Guerard, Bruno, Peronnard, Paul, Mansour, Wassim, Pancher, Fabrice, Bezerra, Francoise

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.22 MB

english, 2011

14

Low energy proton induced SEE in memories

Duzellier, S., Ecoffet, R., Falguere, D., Nuns, T., Guibert, L., Hajdas, W., Calvert, M.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1997

Language:

english

File:

PDF, 541 KB

english, 1997

15

[IEEE RADECS 2001. 2001 6th European Conference on Radiation and its Effects on Components and Systems - Grenoble, France (10-14 Sept. 2001)] RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) - Contribution of GEANT4 to the determination of sensitive volumes in case of high-integrated RAMs

Inguimbert, C., Duzellier, S., Ecoffet, R.

Year:

2002

Language:

english

File:

PDF, 389 KB

english, 2002

16

SEU rate calculation with GEANT4 (comparison with CREME 86)

Inguimbert, C., Duzellier, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2004

Language:

english

File:

PDF, 297 KB

english, 2004

17

Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

Reed, R. A., Weller, R. A., Akkerman, A., Barak, J., Culpepper, W., Duzellier, S., Foster, C., Gaillardin, M., Hubert, G., Jordan, T., Jun, I., Koontz, S., Lei, F., McNulty, P., Mendenhall, M. H., Mur

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.88 MB

english, 2013

18

Continuous High-Altitude Measurements of Cosmic Ray Neutrons and SEU/MCU at Various Locations: Correlation and Analyses Based-On MUSCA SEP$^{3}$

Hubert, G., Velazco, R., Federico, C., Cheminet, A., Silva-Cardenas, C., Caldas, L. V. E., Pancher, F., Lacoste, V., Palumbo, F., Mansour, W., Artola, L., Pineda, F., Duzellier, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.16 MB

english, 2013

19

Two CMOS memory cells suitable for the design of SEU-tolerant VLSI circuits

Velazco, R., Bessot, D., Duzellier, S., Ecoffet, R., Koga, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1994

Language:

english

File:

PDF, 580 KB

english, 1994

20

[IEEE 2000 IEEE Radiation Effects Data Workshop. Workshop Record - Reno, NV, USA (24-28 July 2000)] 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) - Management of radiation issues for using commercial non-hardened parts on the INTEGRAL Spectrometer project

Vergnault, E., Ecoffet, R., Millot, R., Duzellier, S., Guibert, L., Chabaud, J.P., Cotin, F.

Year:

2000

Language:

english

File:

PDF, 493 KB

english, 2000

21

[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - An overview of the applications of a pulsed laser system for SEU testing

Pouget, V., Fouillat, P., Lewis, D., Lapuyade, H., Sarger, L., Roche, F.M., Duzellier, S., Ecoffet, R.

Year:

2000

Language:

english

File:

PDF, 600 KB

english, 2000

22

[IEEE 2000 IEEE Radiation Effects Data Workshop. Workshop Record - Reno, NV, USA (24-28 July 2000)] 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) - EXEQ I-IV: SEE in-flight measurement on the MIR orbital station

Falguere, D., Duzellier, S., Ecoffet, R., Tsourilo, I.

Year:

2000

Language:

english

File:

PDF, 526 KB

english, 2000

23

Contribution of GEANT4 to the determination of sensitive volumes in case of high-integrated RAMs

Inguimbert, C., Duzellier, S., Ecoffet, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2002

Language:

english

File:

PDF, 340 KB

english, 2002

24

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - In flight observation of proton induced destructive single event phenomena

Bezerra, Francoise, Lorfevre, Eric, Ecoffet, Robert, Peyre, Daniel, Binois, Christain, Duzellier, Sophie, Falguere, Didier, Nuns, Thierry, Melotte, Michel, Calvel, Philippe, Marec, Ronan, Chatry, Nath

Year:

2009

Language:

english

File:

PDF, 343 KB

english, 2009

25

Application of laser testing in study of SEE mechanisms in 16-Mbit DRAMs

Duzellier, S., Falguere, D., Guibert, L., Pouget, V., Fouillat, P., Ecoffet, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2000

Language:

english

File:

PDF, 200 KB

english, 2000

26

Operational SER Calculations on the SAC-C Orbit Using the Multi-Scales Single Event Phenomena Predictive Platform (MUSCA ${\rm SEP}^{3}$)

Hubert, Guillaume, Duzellier, Sophie, Inguimbert, Christophe, Boatella-Polo, CÉsar, Bezerra, FranÇoise, Ecoffet, Robert

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.95 MB

english, 2009

27

Influence of solar cycle on SPOT-1,-2,-3 upset rates

Ecoffet, R., Prieur, M., Del Castillo, M.F., Duzellier, S., Falguere, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 472 KB

english, 1995

28

[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - Heavy ion test results on memories

Ecoffet, R., Labrunee, M., Duzellier, S., Falguere, D.

Year:

1992

Language:

english

File:

PDF, 554 KB

english, 1992

29

Evaluation of Recent Technologies of Nonvolatile RAM

Nuns, Thierry, Duzellier, Sophie, Bertrand, Jean, Hubert, Guillaume, Pouget, Vincent, Darracq, FrÉdÉric, David, Jean-Pierre, Soonckindt, Sabine

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 1.72 MB

english, 2008

30

From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II

Harboe-Sorensen, R., Poivey, C., Guerre, F.-X., Roseng, A., Lochon, F., Berger, G., Hajdas, W., Virtanen, A., Kettunen, H., Duzellier, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 748 KB

english, 2008

31

SEE results using high energy ions

Duzellier, S., Falguere, D., Mouliere, L., Ecoffet, R., Buisson, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 631 KB

english, 1995

32

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - MUSCA SEP3 contributions to investigate the direct ionization proton upset in 65nm technology for space, atmospheric and ground applications

Hubert, G., Duzellier, S., Bezerra, F., Ecoffet, R.

Year:

2009

Language:

english

File:

PDF, 318 KB

english, 2009

33

[IEEE . RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems - La Grande-Motte, France (9-12 Sept. 1991)] . RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems - Heavy ion effects on SPOT satellites comparison between on-orbit observation and upset rate prediction

Chapuis, T., Ecoffet, R., Kerjean, L., Duzellier, S., Falguere, D., Rosier, L.H.

Year:

1992

Language:

english

File:

PDF, 367 KB

english, 1992

34

Recent trends in single-event effect ground testing

Duzellier, S., Ecoffet, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 862 KB

english, 1996

35

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - ICARE on-board SAC-C: More than 8 years of SEU & MCU, analysis and prediction

Boatella, C., Hubert, G., Ecoffet, R., Duzellier, S.

Year:

2009

Language:

english

File:

PDF, 797 KB

english, 2009

36

Evaluation of the upset risk in CMOS SRAM through full three dimensional simulation

Moreau, Y., Duzellier, S., Gasiot, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 818 KB

english, 1995

37

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - 0.6 μm CMOS technology with radiation tolerant features application to 8 K×16 dual port RAM and sea of gates

Corbiere, T., Lassere, V., Thomas, B., Hachad, S., Ecoffet, R., Duzellier, S.

Year:

1996

Language:

english

File:

PDF, 509 KB

english, 1996

38

Radiation environment measurements with SPICA on-board the MIR station

Barde, S., Cueto, J., Ecoffet, R., Falguere, D., Nuns, T., Duzellier, S., Boscher, D., Bourdarie, S., Tsourilo, I.

Journal:

IEEE Transactions on Nuclear Science

Year:

2002

Language:

english

File:

PDF, 318 KB

english, 2002

39

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Evaluation of recent technologies of non-volatile RAM

Nuns, T., Duzellier, S., Bertrand, J., Hubert, G., Pouget, V., Darracq, F., David, J. P., Soonckindt, S.

Year:

2007

Language:

english

File:

PDF, 4.96 MB

english, 2007

40

Probing With Heavy Ions the SET Sensitivity of Linear Devices

Duzellier, Sophie, Inguimbert, Christophe, Nuns, Thierry, Bezerra, Francoise, Dangla, David

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 1.32 MB

english, 2008

41

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Collected charge analysis for a new advanced transient model by TCAD simulation in 90nm technology

Artola, L., Hubert, G., Bezerra, F., Duzellier, S., Castellani-Coulie, K.

Year:

2009

Language:

english

File:

PDF, 447 KB

english, 2009

42

[IEEE 1993 IEEE Radiation Effects Data Workshop - Snowbird, UT, USA (21 July 1993)] 1993 IEEE Radiation Effects Data Workshop - Heavy Ton / Proton Test Results On High Integrated Memories

Duzellier, S., FaIguere, D., Ecoffet, R.

Year:

1993

Language:

english

File:

PDF, 545 KB

english, 1993

43

[IEEE . RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems - La Grande-Motte, France (9-12 Sept. 1991)] . RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems - Heavy ion component test coordination

Labrunee, M., Beacour, J., Romero, M., Ecoffet, R., Dufour, C., Duzellier, S.

Year:

1992

Language:

english

File:

PDF, 300 KB

english, 1992

44

SEU sensitive depth in a submicron SRAM technology

Detcheverry, C., Ecoffet, R., Duzellier, S., Lorfevre, E., Bruguier, G., Barak, J., Lifshitz, Y., Palau, J.M., Casiot, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1998

Language:

english

File:

PDF, 531 KB

english, 1998

45

[IEEE 2002 Nuclear and Space Radiation Effects Conference - Phoenix, AZ, USA (15-19 July 2002)] IEEE Radiation Effects Data Workshop - SEE in-flight data for two static 32KB memories on high earth orbit

Duzellier, S., Bourdarie, S., Velazco, R., Nicolescu, B., Ecoffet, R.

Year:

2002

Language:

english

File:

PDF, 500 KB

english, 2002

46

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - EXEQ II and III: On-board experiments for the study of single events

Duzellier, S., Falguere, D., Ecoffet, R., Tsourilo, I.

Year:

1998

File:

PDF, 669 KB

1998

47

Using Subthreshold Heavy Ion Upset Cross Section to Calculate Proton Sensitivity

Inguimbert, Christophe, Duzellier, Sophie, Nuns, Thierry, Bezerra, FranÇoise

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 653 KB

english, 2007

48

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - SEU sensitive depth in a submicron SRAM technology

Detcheverry, C., Ecoffet, R., Duzellier, S., Lorfevre, E., Bruguier, G., Barak, J., Lifshitz, Y., Palau, J.M., Gasiot, J.

Year:

1998

Language:

english

File:

PDF, 466 KB

english, 1998

49

Using a carbon beam as a probe to extract the thickness of sensitive volumes

Inguimbert, C., Duzellier, S., Ecoffet, R., Guibert, L., Barak, J., Chabot, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2000

Language:

english

File:

PDF, 472 KB

english, 2000

50

[IEEE 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) - Tampa, FL, USA (2013.06.16-2013.06.21)] 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) - Development status of triple-junction solar cells optimized for low intensity low temperature applications

Baur, Carsten, Khorenko, Victor, Siefer, Gerald, Bourgoin, Jacques C., Casale, Mariacristina, Campesato, Roberta, Duzellier, Sophie, Inguimbert, Virginie

Year:

2013

Language:

english

File:

PDF, 508 KB

english, 2013

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